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Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometer FIB-TOF-SIMS

FILMER - high resolution surface analysis and microscopy system

Features | Specification | Photos | Data1 | Data2 | Example1 | Example2 | Example3

Example: Toner Particle

FIB Fine Processing can extend the subject to be analysed

FILMER data

 

Example: Coal fly ash - Surface and Cross section

FILMER data

 

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