Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometer FIB-TOF-SIMS
FILMER - high resolution surface analysis and microscopy system
Features | Specification | Photos | Data1 | Data2 | Example1 | Example2 | Example3
Compatibility between High Lateral Resolution and Mass Resolution
Comparison between SIMS and Laser SNMS images
Analysis of a blend polymer of polystyrene and polyhydrostyrene showing the nano scale mapping of the phase separated structure of the organic polmer mixture.