Jet Cooling Resonance Enhanced Multi Photon Ionisation
Time-of-flight Mass Spectromter Jet-REMPI
Data from car exhausts analysed using Jet-REMPI TOF-MS
Published data
- Synchrotron Beamlines
- XFEL Components
- Analytical Instruments
- Accelerator Components
- Thin Film Deposition
- Semiconductor Technology
- Vacuum Chambers
- Vacuum Components
- Special projects
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Jet Cooling Resonance Enhanced Multi Photon Ionisation